首页> 外国专利> Measuring instantaneous signal dependent nonlinear distortion in response to varying frequency sinusoidal test signals

Measuring instantaneous signal dependent nonlinear distortion in response to varying frequency sinusoidal test signals

机译:响应变化的频率正弦测试信号,测量瞬时信号相关的非线性失真

摘要

A method of measuring instantaneous signal-dependent nonlinear distortion in a system under test in response to a test signal having a varying frequency sinusoidal component, such as a swept frequency signal or a multi-burst signal, uses a time window to locate a frequency of interest in the corresponding varying frequency component of a signal output from the system under test. Once the location of the frequency of interest is located in the output signal, a spectrum of the portion of the output signal within the time window is generated and the magnitudes of the spectral peaks, including the spectral peak for the frequency of interest or nominal frequency and all isolated peaks representing distortion frequencies, are measured. The amount of distortion is calculated as a ratio of the square-root of the sum of the magnitudes of the distortion frequencies to the magnitude of the nominal frequency.
机译:一种响应于具有变化频率正弦分量的测试信号(例如扫频信号或多脉冲信号)而在被测系统中测量瞬时信号相关的非线性失真的方法,该方法使用时间窗口来定位频率对从被测系统输出的信号的相应变化频率分量感兴趣。一旦感兴趣的频率的位置位于输出信号中,就会生成时间窗口内输出信号部分的频谱,并且频谱峰值的幅度,包括感兴趣频率或标称频率的频谱峰值并测量所有代表失真频率的孤立峰。失真量被计算为失真频率的大小之和的平方根与标称频率的大小之比。

著录项

  • 公开/公告号US2005233702A1

    专利类型

  • 公开/公告日2005-10-20

    原文格式PDF

  • 申请/专利权人 KEVIN M. FERGUSON;

    申请/专利号US20050090493

  • 发明设计人 KEVIN M. FERGUSON;

    申请日2005-03-23

  • 分类号H04B17/00;H04B10/04;H04B10/12;

  • 国家 US

  • 入库时间 2022-08-21 22:24:52

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