首页> 外国专利> Wavelet analysis of one or more acoustic signals to identify one or more anomalies in an object

Wavelet analysis of one or more acoustic signals to identify one or more anomalies in an object

机译:对一个或多个声信号进行小波分析以识别物体中的一个或多个异常

摘要

In one embodiment, a method for wavelet analysis of one or more acoustic signals to identify one or more anomalies in an object includes receiving an acoustic signal from an acoustic scan of an object and calculating a wavelet power spectrum of the acoustic signal. The method also includes accessing a library of one or more reference wavelet power spectra that each correspond to one or more objects that comprise one or more known anomalies and comparing the wavelet power spectrum with one or more reference wavelet power spectra. If the wavelet power spectrum from the acoustic scan corresponds to one or more reference wavelet power spectra, analysis results are communicated indicating that the object under analysis comprises one or more particular known anomalies corresponding to the one or more reference wavelet power spectra that correspond to the wavelet power spectrum. If the wavelet power spectrum does not correspond to one or more reference wavelet power spectra, analysis results are communicated indicating that the object under analysis lacks the one or more known anomalies that the one or more reference wavelet power spectra in the library correspond to.
机译:在一个实施例中,一种用于对一个或多个声信号进行小波分析以识别对象中的一个或多个异常的方法包括:从对象的声扫描接收声信号,并计算声信号的小波功率谱。该方法还包括访问一个或多个参考小波功率谱的库,该库分别与包括一个或多个已知异常的一个或多个对象相对应,并将小波功率谱与一个或多个参考小波功率谱进行比较。如果来自声扫描的小波功率谱与一个或多个参考小波功率谱相对应,则传达分析结果,指示分析中的对象包括一个或多个特定的已知异常,该异常对应于与一个或多个参考小波功率谱相对应。小波功率谱。如果小波功率谱与一个或多个参考小波功率谱不对应,则传达分析结果,表明分析中的对象缺少库中一个或多个参考小波功率谱所对应的一个或多个已知异常。

著录项

  • 公开/公告号US2005021263A1

    专利类型

  • 公开/公告日2005-01-27

    原文格式PDF

  • 申请/专利权人 KARTIK RAMANUJACHAR;

    申请/专利号US20030749886

  • 发明设计人 KARTIK RAMANUJACHAR;

    申请日2003-12-31

  • 分类号G06F19/00;

  • 国家 US

  • 入库时间 2022-08-21 22:23:29

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