Semiconductor device having one-chip microcomputer and over-voltage application testing method

摘要

A booster circuit is incorporated in a one-chip microcomputer. In a test mode, a burn-in test is performed by switching power supply systems so that a power supply voltage of 5V is supplied to a 3.3V-type circuit section that normally operates on a power supply voltage of 3.3V in an ordinary state and a boosted voltage of a 5V booster circuit is supplied to a 5V-type circuit section that normally operates on a power supply voltage of 5V in the ordinary state.