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Identifying optical fiber segments and determining characteristics of an optical device under test based on fiber segment scatter pattern data
Identifying optical fiber segments and determining characteristics of an optical device under test based on fiber segment scatter pattern data
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机译:根据光纤段散射图案数据识别光纤段并确定被测光学设备的特性
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摘要
Complex data is obtained from OFDR backscatter measurements for an optical device under test (DUT). That complex scatter pattern data may be used along with a previously-determined fiber segment pattern to identify the fiber segment within the DUT, even when the DUT is an optical network DUT that includes multiple fibers coupled to perform one or more functions. In other non-limiting example applications, the OFDR scatter pattern data can be used to identify where in the DUT a loss occurred and where in the DUT a temperature change occurred.
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