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Using surface microwaves for measuring and determining density and/or moisture content of a material

机译:使用表面微波测量和确定材料的密度和/或水分含量

摘要

Using surface microwaves for measuring and determining density and/or moisture content of a material. Positioning material within a proximate free space region spanning immediately above surface of a surface microwave waveguide, the surface microwave waveguide includes an electrically conducting rectangular block and a dielectric rectangular insert element compactly fitting into the block. Transmitting microwaves into the first end of the surface microwave waveguide, a first portion of the transmitted microwaves propagate within the surface microwave waveguide and a second portion propagates within the proximate free space region including the material. Parameters (amplitude, phase, attenuation, and phase shift) of the propagating microwaves are perturbed by the material and are a function of density and/or moisture content of the material. Receiving the portions of propagating microwaves exiting the surface microwave waveguide, whereby the parameters of the transmitted and received microwaves are useable for determining density and/or moisture content of the material.
机译:使用表面微波来测量和确定材料的密度和/或水分含量。将材料定位在紧邻表面微波波导表面上方的附近自由空间区域内,表面微波波导包括导电矩形块和紧密配合到该块中的电介质矩形插入元件。将微波传输到表面微波波导的第一端,传输的微波的第一部分在表面微波波导内传播,第二部分在包​​括材料的邻近自由空间区域内传播。传播微波的参数(幅度,相位,衰减和相移)会受到材料的干扰,并且是材料密度和/或水分含量的函数。接收传播的微波离开表面微波波导的部分,由此发射和接收的微波的参数可用于确定材料的密度和/或水分含量。

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