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Method and apparatus to evaluate dielectrically-anisotropic materials using analysis of multiple microwave signals in different planes of polarization

机译:通过分析不同极化平面中的多个微波信号评估介电各向异性材料的方法和装置

摘要

An apparatus for evaluating dielectrically-artisotropic materials comprising a plurality of microwave transmitters with more than two planes of polarization, and a plurality of microwave receivers with differing planes of polarization, wherein each transmitter includes a modulator modulating the transmitted microwave beam, the transmitters and receivers arranged, relative to a workpiece to be measured, so as to cooperate in communication therebetween, and wherein connected to each receiver is a device to identify the received amplitude and phase of a component of the transmitted microwave beam, and wherein connected to each receiver is a processor for analyzing the received signals to take more than two measurements including measuring the principal axes, attenuations and phase shifts of the received microwave beam.
机译:一种用于评估介电各向异性材料的装置,该装置包括多个具有两个以上偏振面的微波发射器和多个具有不同偏振面的微波接收器,其中每个发射器均包括调制器,用于调制发射的微波束,该发射器和接收器相对于要测量的工件进行布置,以便在它们之间进行通信协作,并且其中连接到每个接收器的是用于识别所接收的微波束的分量的接收振幅和相位的装置,并且其中连接到每个接收器的是处理器,用于分析所接收的信号以进行两个以上的测量,包括测量所接收的微波束的主轴,衰减和相移。

著录项

  • 公开/公告号US6842010B2

    专利类型

  • 公开/公告日2005-01-11

    原文格式PDF

  • 申请/专利权人 JACEK M. BIERNACKI;

    申请/专利号US20020158152

  • 发明设计人 JACEK M. BIERNACKI;

    申请日2002-05-31

  • 分类号G01R2732;

  • 国家 US

  • 入库时间 2022-08-21 22:20:58

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