Automatic test vector generation method, test method making use of the test vectors as automatically generated, chip manufacturing method and automatic test vector generation program

摘要

A technique for automatically generating test vectors comprises an ISA specification analysis step of analyzing specifications of an instruction set architecture (ISA) of a processor (S101); a test vector generation data preparation step of preparing data required for generating test vectors (S103); and a test vector generation step of generating test vectors by the use of said data (S105).