首页> 外国专利> METHOD AND SAMPLING DEVICE FOR DETECTION OF LOW LEVELS OF A PROPERTY/QUALITY TRAIT PRESENT IN AN INHOMOGENEOUSLY DISTRIBUTED SAMPLE SUBSTRATE

METHOD AND SAMPLING DEVICE FOR DETECTION OF LOW LEVELS OF A PROPERTY/QUALITY TRAIT PRESENT IN AN INHOMOGENEOUSLY DISTRIBUTED SAMPLE SUBSTRATE

机译:检测非均匀分布样品基质中质量/品质特征低水平的方法和采样装置

摘要

A process for detecting low levels of a predetermined quality trait in an inhomogeneously distributed particulate substrate (22) involving the steps of: (a) providing a particulate substrate (22) to be analyzed; (b) providing a spectrometer (12) with an electromagnetic detector capable of performing spectroscopic measurements with electromagnetic radiation; (c) providing a rotatable sample holder (14) having a transparent area through which electromagnetic radiation may pass; (d) providing a tumbling member (18) located within the rotatable sample holder (14) for tumbling the particulate substrate (22) contained therein; (e) introducing the particulate substrate (22) into the rotatable sample holder (14); (f) simultaneously rotating and tumbling the particulate substrate (22) contained within the rotatable sample holder (14); and (g) activating the spectrophotometer (12).
机译:一种用于在不均匀分布的颗粒基质(22)中检测低水平的预定质量特征的方法,该方法包括以下步骤:(a)提供待分析的颗粒基质(22); (b)提供一种具有电磁检测器的光谱仪(12),该电磁检测器能够利用电磁辐射进行光谱测量; (c)提供具有透明区域的可旋转样品架(14),电磁辐射可以穿过该透明区域; (d)提供位于可旋转样品保持器(14)内的翻滚构件(18),用于翻滚容纳在其中的颗粒基质(22); (e)将颗粒基质(22)引入可旋转样品架(14)中; (f)同时旋转和翻滚包含在可旋转样品架(14)中的颗粒基质(22); (g)启动分光光度计(12)。

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