TANDEM REPEAT DETERMINATION BY CONCURRENT ANALYSIS OF MULTIPLE TANDEM DUPLEX CONFIGURATIONS

摘要

Disclosed is a method of analyzing tandem repeats using one or more probes, each such probe may lack an anchoring sequence but contains one or more tandem repeat sequences complementary to the target tandem repeat sequences. In one embodiment, each probe is attached, via its 5' end, to an encoded microparticle ("bead"), wherein the code - implemented by way of a color scheme - identifies the sequence and length of the probe attached thereto. Also disclosed are methods relating to the analysis of partial duplex configurations involving only partial overlap between probe and target repeats and thus "overhangs" of probe repeats on the 3' and/or 5' ends of the target repeats.