ELECTRONIC SWITCHING CIRCUIT, SWITCHING CIRCUIT TEST ARRANGEMENT AND METHOD FOR DETERMINING THE OPERATIVENESS OF AN ELECTRONIC SWITCHING CIRCUIT

摘要

The invention relates to an electronic switching circuit in which a plurality of test circuit blocks is provided, whereby every test circuit block comprises a first sub-circuit block and at least one second sub-circuit block. A field effect transistor in the first sub-circuit block has a gate insulation layer that is thicker than the gate insulation layer of a field effect transistor in the second sub-circuit block.