METHOD FOR DETERMINING A RESIDUAL DEFECTIVENESS AFTER TWO OR MORE NON-DISTRUCTIVE TESTS

摘要

The invention relates to non-distructive testing performed during the production, assembling and use of products. The aim of said invention is to increase the degree of reliability and to simplify the process for determining number of defects remaining in a product after several non-destructive testings. The inventive method for determining residual defectiveness after two or more non-distructive tests consists in determining the reliability of the used non-distructive testing method according to the probability of detection of defects occurring within certain ranges of the dimensions thereof j=1 m, in performing n non-distructive testings, wherein n/=2, in determining, after each i-th non-distructive test, the number of defects occurred within a certain interval of dimensions thereof J-Nj,I, afterwards in correcting defects detected during said non-distructive testings and in determining by calculation the number of defects which occur within a certain interval of dimensions and remain in a product after the n-th non-distructive test, and corresponding correction of defects. In the second and third variants of the method, for determining residual defectiveness of a product, it is sufficient to determine the number of defects which are detected after the first non-distructive testing.