首页> 外国专利> INDUCTIVELY HEATED TRANSIENT THERMOGRAPHY FLAW DETENTION

INDUCTIVELY HEATED TRANSIENT THERMOGRAPHY FLAW DETENTION

机译:感应加热瞬态热成像缺陷检测

摘要

A method and apparatus for non-destructive testing of a structure including the deposition of energy volumetrically into an object and detecting transient temperatures at a surface of the object caused by diffusion of the diposited energy. The energy is typically induced within the object by an induction coil and viewed by an IR camera as the transient energy exist the surface of the object.
机译:一种用于结构的非破坏性测试的方法和设备,包括:将能量体积地沉积到物体中,并检测由所沉积的能量的扩散引起的物体表面处的瞬态温度。能量通常由感应线圈在物体内感应,并在物体表面存在瞬态能量时由IR摄像机查看。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号