HIGHLY SENSITIVE SPECTROMETER ASSEMBLY COMPRISING AN ENTRY SLIT ARRAY AND A DETECTOR ARRAY

摘要

The invention relates to a highly sensitive spectrometer assembly, in which a slit array consisting of parallel individual slits is reproduced on a corresponding detector array with the aid of an optical unit that disperses light in a horizontal direction, splitting it into wavelengths, whereby signals from said detector array are fed to an evaluation device. Characteristic parameters can be determined in a highly precise manner by using fixed slit patterns. To achieve this, the slit array comprises at least one fixed, application-related pattern containing at least two slits that are offset in the dispersion direction by specific values, the spectral images of said slits overlapping on the detector array to form a cumulative spectrum, from which the evaluation device directly extracts the parameters that are to be determined for the application.