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SEMICONDUCTOR DEVICE INCLUDING FIELD OXIDE FOR BURYING TRENCH WITHOUT VOID AND METHOD FOR FORMING TRENCH THEREOF

机译:包括无空隙埋入沟槽的场氧化物的半导体器件及其形成沟槽的方法

摘要

PURPOSE: A semiconductor device and a method for forming a trench thereof are provided to prevent leakage current and short circuit due to a void by filling a trench with a field oxide. CONSTITUTION: A pad oxide layer(12) and a silicon nitride layer(13) are formed on a front surface of a semiconductor substrate(11). A trench is formed by etching the silicon nitride layer, the pad oxide layer, and a predetermined part of the semiconductor substrate. A liner oxide layer is formed on an inner wall of the trench. Electrons are implanted into a backside of the semiconductor substrate. An insulating layer is formed on the liner oxide layer to bury the trench.
机译:目的:提供一种半导体器件及其形成沟槽的方法,以通过用场氧化物填充沟槽来防止由于空隙引起的漏电流和短路。组成:在半导体衬底(11)的前表面上形成了焊盘氧化层(12)和氮化硅层(13)。通过蚀刻氮化硅层,垫氧化物层和半导体衬底的预定部分来形成沟槽。在沟槽的内壁上形成衬垫氧化层。将电子注入到半导体衬底的背面中。在衬里氧化物层上形成绝缘层以掩埋沟槽。

著录项

  • 公开/公告号KR20040105297A

    专利类型

  • 公开/公告日2004-12-16

    原文格式PDF

  • 申请/专利权人 DONGBUANAM SEMICONDUCTOR INC.;

    申请/专利号KR20030036001

  • 发明设计人 PARK GEON UK;

    申请日2003-06-04

  • 分类号H01L21/76;

  • 国家 KR

  • 入库时间 2022-08-21 22:06:24

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