METHOD FOR DETECTING AN OFF PIXEL ADJACENCY INFERIORITY OF A PANEL FOR AN LCD ELEMENT, SPECIALLY CONCERNED IN PREVIOUSLY SORTING OUT AN ITO FILM REMAINING ON A TFT CHANNEL

摘要

PURPOSE: A method for detecting an off pixel adjacency inferiority of a panel for an LCD element is provided to previously detect an ITO(Indium Tin Oxide) film remaining on a TFT substrate, not to cause an off pixel adjacency inferiority in a final inspection step of a panel. CONSTITUTION: A device checks whether ITO films remain in each area(S10). The device sorts out defects only of pixels corresponding to each area(S11), and removes the defects from TFT channel areas(S12). The device confirms whether the defects are removed from the TFT channel areas(S13). If so, the device checks whether a remaining ITO film exists(S14). If so, the device removes the remaining ITO film from the TFT channel areas(S15). A user checks whether the remaining ITO film is removed or dust is attached to a surface of a TFT substrate with a microscope(S20). The device assembles the defect-free TFT substrate into a color filter substrate(S30).