首页> 外国专利> METHOD FOR DETERMINING THICKNESS OF AN OPTICAL DISK, ESPECIALLY CONCERNED WITH DETERMINING THAT THICKNESS OF VARIOUS SIZES OF OPTICAL DISKS PRESENTS THE SAME FLUTTER AMPLITUDE PROPERTY

METHOD FOR DETERMINING THICKNESS OF AN OPTICAL DISK, ESPECIALLY CONCERNED WITH DETERMINING THAT THICKNESS OF VARIOUS SIZES OF OPTICAL DISKS PRESENTS THE SAME FLUTTER AMPLITUDE PROPERTY

机译:确定光盘厚度的方法,尤其要考虑确定各种大小的光盘是否具有相同的颤动放大倍数属性

摘要

PURPOSE: A method for determining thickness of an optical disk is provided to determine thickness of a small-sized optical disk according to a flutter amplitude property, thereby making an optical disk as thin as possible according to a diameter of the small-sized optical disk. CONSTITUTION: Thickness of various sizes of optical disks is determined to present the same flutter amplitude property. A reference disk having 120mm in diameter and 1.2mm in thickness is used such that the optical disks can present the same flutter amplitude property. When the thickness of the optical disks is determined, the disks are manufactured as thin as possible according to the diameter of the disks.
机译:目的:提供一种确定光盘厚度的方法,以根据颤动振幅特性确定小型光盘的厚度,从而使光盘根据小型光盘的直径尽可能薄。组成:确定各种大小的光盘的厚度以显示相同的颤动幅度特性。使用直径为120mm,厚度为1.2mm的参考盘,以使光盘可以表现出相同的颤动幅度特性。当确定光盘的厚度时,根据光盘的直径将光盘制造得尽可能薄。

著录项

  • 公开/公告号KR20050022629A

    专利类型

  • 公开/公告日2005-03-08

    原文格式PDF

  • 申请/专利权人 LG ELECTRONICS INC.;

    申请/专利号KR20030060215

  • 发明设计人 KIM JIN HONG;

    申请日2003-08-29

  • 分类号G11B7/24;

  • 国家 KR

  • 入库时间 2022-08-21 22:05:46

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号