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MOUNT FOR MOUNTING A SAMPLE FOR INSPECTION BY A TRANSMISSION ELECTRON MICROSCOPE AND METHOD OF MANUFACTURING A SAMPLE USING THE SAME
MOUNT FOR MOUNTING A SAMPLE FOR INSPECTION BY A TRANSMISSION ELECTRON MICROSCOPE AND METHOD OF MANUFACTURING A SAMPLE USING THE SAME
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机译:用透射电子显微镜安装用于检查的样品的安装座以及使用该安装点制造样品的方法
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摘要
A method of manufacturing a transmission electron microscope inspection sample. The sample is mounted into a recess in the mount and the sample is grinded to a preset target thickness. A recess for mounting the sample and a groove for separating the sample from the recess are formed on a top surface of the mount. The sample is fixed into the recess using mounting wax. The protruding portion of the sample protrudes above the mount and is grinded by the grinder. The depth of the recess is based on the target thickness of the sample. The protruding portion of the sample is grinded to the top surface of the mount.
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