首页> 外国专利> Share containing the combined particle polishing pad, a production method thereof and a flattening machine comprising the same

Share containing the combined particle polishing pad, a production method thereof and a flattening machine comprising the same

机译:包含组合颗粒抛光垫的份额,其生产方法以及包括该份额的压平机

摘要

The present invention is a polishing pad for use in chemical-mechanical planarization of semiconductor wafers, and a method for making the polishing pad. The polishing pad has a body, molecular bonding links, and abrasive particles dispersed substantially uniformly throughout the body. The body is made from a polymeric matrix material and the molecular bonding links are covalently bonded to the matrix material. Substantially all of the abrasive particles are covalently bonded to at least one molecular bonding link. The molecular bonding links securely affix the abrasive particles to the matrix material to enhance the uniformity, of the distribution of the abrasive particles throughout the pad and to substantially prevent the abrasive particles from breaking away from the pad.
机译:本发明是用于半导体晶片的化学机械平面化的抛光垫,以及制造该抛光垫的方法。抛光垫具有主体,分子键连接和基本上均匀地分散在整个主体中的磨料颗粒。主体由聚合物基体材料制成,并且分子键合键与基体材料共价键合。基本上所有的磨料颗粒都与至少一个分子键连接共价键合。分子结合链牢固地将磨料颗粒固定到基质材料上,以提高磨料颗粒在整个垫中的分布的均匀性,并基本上防止磨料颗粒从垫上脱落。

著录项

  • 公开/公告号KR100459528B1

    专利类型

  • 公开/公告日2005-06-02

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR19980705588

  • 发明设计人 로빈슨 칼 엠.;

    申请日1998-07-22

  • 分类号B24D3/28;B24D3/34;

  • 国家 KR

  • 入库时间 2022-08-21 22:04:17

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