Method for generating test pattern capable of simultaneous testing of cluster and edge

摘要

The present invention is to provide a method for generating a test pattern for performing boundary scan testing as a cluster test and an edge test at the same time, this invention, by implementing the boundary scan test unit to the circuit PCB a device consisting of a boundary scan register test through generated to enable the cluster portion and the edge portion at the same time the boundary scan test performs a PCB pattern to the boundary scan test includes a test data input and a test mode signal and a test data output, and expected test data output (TDO) bit stream pattern which is set as an attribute of the specific features of the chip. Displaying the bitstream patterns and, critical state value of a bit stream pattern with said edge portion for indicating a critical state value to the expected TDO for the cluster part for indicating whether or not a reset and performs a sampling of the TAP controller to the expected TDO It characterized in that it comprises a bit stream patterns to and the cluster portion and an edge portion that is not a chain of boundary scan cells in conjunction at the same time improve the error recovery ratio of the boundary scan test by enabling the test to increase the test performance can.