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Photoresist composition for Top-surface Imaging Process by Silylation

机译:用于硅烷化的顶面成像工艺的光刻胶组合物

摘要

When the present invention relates to a TIPS (Top-Surface Imaging Process by Silylation) TIPS process using the photoresist composition, and the composition, by using the photoresist composition of the present invention comprises the amino acid as an additive do the TIPS process, the exposure area when the acid is generated in the entering into the non-exposed areas to serve to the amino acid added to the photoresist composition to hold the acid improves the exposed area and the unexposed regions daejobi of by the small amount of acid on moving in an exposure area in the conventional method the chamber relation (silylation) area can be greatly reduced LER (line edge roughness) produced in the department As dry developing process.
机译:当本发明涉及使用光致抗蚀剂组合物的TIPS(通过硅烷化进行的顶表面成像方法)TIPS方法,并且该组合物通过使用本发明的光致抗蚀剂组合物在TIPS方法中包含氨基酸作为添加剂时,在进入未曝光区域时产生酸,以使添加到光致抗蚀剂组合物中的氨基酸保持酸的曝光区域,通过移动少量的酸而改善了曝光区域和未曝光区域daejobi。在常规方法中的曝光区域中,腔室关系(硅烷化)区域可以大大减小在干显影过程中产生的LER(线边缘粗糙度)。

著录项

  • 公开/公告号KR100474544B1

    专利类型

  • 公开/公告日2005-03-08

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR19990050093

  • 发明设计人 고차원;

    申请日1999-11-12

  • 分类号G03F7/039;

  • 国家 KR

  • 入库时间 2022-08-21 22:04:06

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