A METHOD FOR TESTING INTEGRATED MEMORY USING AN INTEGRATED DMA CONTROLLER

摘要

The microcontroller includes an integrated memory and an integrated DMA controller. During testing, using the DMA controller performs the read / write tests of the background pattern of the integrated memory and its complement. Integrated memory is not necessary to include the BIST logic typically required for these integrated memory. By performing the BIST type test by using a DMA controller, and it is not limited to test the hardware. Typically, BIST logic that were part of the integrated memory is designed and tested during the design of the microcontroller. This design and test time can be replaced by a (possibly less than) for generating test vectors required for DMA transfer operations. The use of the test method of the present invention, there is reduced a risk that in the BIST test may cause errors. Conventionally, when it is found that there is an error in the BIST logic, and in order to solve this problem is required, new manufacturing masks for the microcontroller. A lot of time and monetary investment was required. The method of the present invention enables the modifications and variations of the test by repeating the simulation tests and creating new test vectors. Thereafter, the new test vectors may be applied to the micro-controller manufactured previously.