DEVICE FOR MEASUREMENT OF COMPLEX PERMITTIVITY OF LOW- IMPEDANCE MATERIALS AT MICROWAVE FREQUENCIES

摘要

FIELD: radio measurements of parameters of absorbing low-impedance dielectric materials at microwave frequencies, in particular, measur5ement of the complex relative permittivity and the loss tangent of a dielectric of composite materials characterized by high values of complex relative permittivity and conductance.;SUBSTANCE: measurements are taken with the aid of a waveguide traveling-wave resonator, the values of the complex permittivity are determined by the measured values of resonance frequency, attenuation and quality of resonance frequency, attenuation and quality factor.;EFFECT: enhanced precision of measurement of the value of the complex permittivity of low-impedance dielect6ric materials at microwave frequencies, having high values of complex permittivity .;2 cl, 1 dwg