Data interface circuit for data exchange between integrated circuit and external circuit with data protocol unit preparing exchangeable data, with test data buffer, transmitting stored data in test mode to protocol unit

摘要

Interface circuit contains data protocol unit (10), preparing exchangeable data for transmission protocol, and test data buffer (42) for later transmission of test data in testing mode, via data bus (43) of integrated circuit (1), to data protocol unit. There are several input/output units (5-i) connectable to external circuit via data terminals (3-i), each unit comprising transmit and reception drivers (6-i;7-i) for signal amplifying and memory unit (21-i) with specified function, comparator unit (47) reads-out buffer stored data and compares them with data stored in test data buffer. Independent claims are included for input/output unit and method for testing data interface circuit within integrated circuit of memory components.