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Sample preparation method for transmission electron microscopy in which material is first removed from a sample using ultra-short pulse laser ablation under vacuum and then inert gas ions are fired at the remaining thin bar
Sample preparation method for transmission electron microscopy in which material is first removed from a sample using ultra-short pulse laser ablation under vacuum and then inert gas ions are fired at the remaining thin bar
Method for preparing material samples for transmission electron microscopy in which material is removed from the samples using ultra-short pulse laser ablation within a vacuum chamber. The resulting remaining narrow bar is then processed using inert gas ions so that the bar becomes transparent to electrons.
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