首页> 外国专利> Measuring device manufacturing method for determining and/or monitoring process factor, involves modifying vibration characteristics of mechanically vibrating unit if difference between its frequencies is greater than tolerance value

Measuring device manufacturing method for determining and/or monitoring process factor, involves modifying vibration characteristics of mechanically vibrating unit if difference between its frequencies is greater than tolerance value

机译:用于确定和/或监控过程因数的测量装置制造方法,包括在机械振动单元的频率之间的差大于公差值时修改其振动特性

摘要

The method involves inciting a mechanically vibrating unit, and receiving vibrations of the unit. An adjustable incitement frequency of the unit is varied and the vibrations are evaluated in such a manner that resonance frequencies of the unit are determined. The vibration characteristics of the unit is modified if a difference in the frequencies is greater than a given tolerance value. Independent claims are also included for the following: (A) a device for the manufacture of a measuring device (B) a measuring device for determination and/or inspection of a process factor.
机译:该方法包括激发机械振动的单元,并接收该单元的振动。改变单元的可调激励频率,并以确定单元共振频率的方式评估振动。如果频率差大于给定的公差值,则会修改设备的振动特性。对于以下各项也包括独立权利要求:(A)用于制造测量装置的装置(B)用于确定和/或检查工艺因素的测量装置。

著录项

  • 公开/公告号DE102004018506A1

    专利类型

  • 公开/公告日2005-11-03

    原文格式PDF

  • 申请/专利权人 ENDRESS + HAUSER GMBH + CO. KG;

    申请/专利号DE20041018506

  • 发明设计人 LOPATIN SERGEJ;WEGNER HANS-PETER;

    申请日2004-04-14

  • 分类号G01F23/296;

  • 国家 DE

  • 入库时间 2022-08-21 22:00:48

相似文献

  • 专利
  • 外文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号