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TEMPERATURE MEASURING INSTRUMENT, HEAT TREATMENT DEVICE, AND TEMPERATURE MEASURING METHOD

机译:温度测量仪器,热处理装置和温度测量方法

摘要

PROBLEM TO BE SOLVED: To provide a temperature measuring instrument capable of measuring a temperature of a measured object, using a microwave.;SOLUTION: This temperature measuring instrument for measuring the temperature, based on a propagation path difference between the first reflected wave M1 reflected from a surface and the second reflected wave M2 reflected from a reverse face, by irradiating the measured object W with a measuring wave, is provided with a divider 50 for dividing the microwave into a measuring wave S1 and a reference wave R1, a directional coupler 52 for inputting the measuring wave, an antenna part 44 for the measuring wave, a phase shifter 54 for outputting the reference wave while changing a phase thereof, a coupler 56 for coupling an interference wave of the first and second reflected waves with the phase changed reference wave from the phase shifter to form an interference wave, an electric power detecting part for detecting an output therefrom, and a temperature computing part 60 having preliminarily a reference value of the propagation path difference with respect to the temperature, and for finding the temperature of the measured object, based on a detection result in the electric power detecting part.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:提供一种能够使用微波来测量被测物的温度的温度测量仪;解决方案:该温度测量仪用于基于第一反射波M1反射的传播路径之差来测量温度。从表面和从背面反射的第二反射波M2通过向测量对象W照射测量波而设置有用于将微波划分为测量波S1和参考波R1的分波器50,定向耦合器。用于输入测量波的52,用于测量波的天线部分44,用于在改变参考波的同时输出参考波的移相器54,用于将第一和第二反射波的干涉波与改变了的相位耦合的耦合器56来自移相器以形成干扰波的参考波,用于检测来自其的输出的电力检测部分以及温度精确计算部分60具有相对于温度的传播路径差的参考值,并且用于基于电力检测部分中的检测结果来找到被测物体的温度。COPYRIGHT:(C)2007,日本特许厅

著录项

  • 公开/公告号JP2006284542A

    专利类型

  • 公开/公告日2006-10-19

    原文格式PDF

  • 申请/专利权人 TOKYO ELECTRON LTD;

    申请/专利号JP20050108752

  • 发明设计人 KASAI SHIGERU;

    申请日2005-04-05

  • 分类号G01K11/30;C23C16/44;G01K5/52;H01L21/205;H01L21/22;H01L21/324;H01L21/3065;

  • 国家 JP

  • 入库时间 2022-08-21 21:57:12

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