首页> 外国专利> PROBE FOR CAPACITANCE TYPE DISPLACEMENT METER AND CAPACITANCE TYPE DISPLACEMENT METER USING SAME

PROBE FOR CAPACITANCE TYPE DISPLACEMENT METER AND CAPACITANCE TYPE DISPLACEMENT METER USING SAME

机译:电容式位移计的探头和电容式位移计使用相同的探头

摘要

PROBLEM TO BE SOLVED: To fix an object under measurement from above in performing measurement by using a probe for a capacitance type displacement meter and also to use other instruments.;SOLUTION: This probe for a capacitance type displacement meter is equipped with an annular measurement electrode 12, an inside protection electrode 11 provided inside the measurement electrode 12, and an outside protection electrode 13 provided outside the measurement electrode 12, and further is equipped with a through hole 15 provided inside the protection electrode 11. In measuring displacement with the measurement electrode 12 disposed above the object under measurement, the object can be fixed from above with a tool made of metal inserted through a through hole 15.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:在使用电容式位移计的探头进行测量时,要从上方固定被测物体,并使用其他仪器。解决方案:此电容式位移计的探头配有环形测量电极12,设置在测量电极12内部的内部保护电极11以及设置在测量电极12外部的外部保护电极13,并且还具有设置在保护电极11内部的通孔15。电极12放置在被测物体上方,可以用金属工具通过通孔15从上方固定物体; COPYRIGHT:(C)2007,JPO&INPIT

著录项

  • 公开/公告号JP2006292480A

    专利类型

  • 公开/公告日2006-10-26

    原文格式PDF

  • 申请/专利权人 IWATSU TEST INSTRUMENTS CORP;

    申请/专利号JP20050111239

  • 发明设计人 SAITO HIROYUKI;

    申请日2005-04-07

  • 分类号G01D5/24;

  • 国家 JP

  • 入库时间 2022-08-21 21:56:51

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