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ANALYTICAL APPARATUS AND TESTING METHOD

机译:分析仪器和测试方法

摘要

PROBLEM TO BE SOLVED: To provide an analytical apparatus made intelligent which can improve the productivity and reliability of analytical operations, in quantitative analyses of harmful elements in metallic materials and nonmetallic materials.;SOLUTION: The analytical apparatus which supports detecting of harmful elements in a component or a material, includes a control means which controls processes in the analytical apparatus, and a measurement result acquiring means which acquires the result of a quantitative measurement carried out by a fluorescent X-ray measuring device by using a fluorescent X-ray analyzing method, based on the measurement conditions prepared by the control means. The control means comprises a raw material determining means for determining the raw material of components or materials; and a presence-of-substance determining means which brings the fluorescent X-ray measuring device to carry out the quantitative measurement, in accordance with the measurement conditions specified on the basis of a fluorescent X-ray spectrum of the raw material, based on the result of the raw material containment determining means, and which determines the presence of a substance containing the specified elements, based on a result of the quantitative measurement.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:要解决的问题:提供一种智能化的分析仪器,可以对金属材料和非金属材料中的有害元素进行定量分析,从而提高分析操作的生产率和可靠性。部件或材料包括:控制装置,其控制分析装置中的处理;以及测量结果获取装置,其通过使用荧光X射线分析方法来获取由荧光X射线测量装置进行的定量测量的结果。 ,根据控制装置准备的测量条件。控制装置包括用于确定组分或材料的原材料的原材料确定装置;以及物质存在判定单元,其根据所述原料的荧光X射线光谱,根据所确定的测定条件,使所述荧光X射线测定装置进行定量测定。原材料容纳量确定装置的结果,并根据定量测量结果确定包含指定元素的物质的存在。版权所有:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP2006119108A

    专利类型

  • 公开/公告日2006-05-11

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP20040321007

  • 发明设计人 HIDA YUKO;NOGUCHI MICHIKO;YAMAGISHI YASUO;

    申请日2004-11-04

  • 分类号G01N23/223;

  • 国家 JP

  • 入库时间 2022-08-21 21:56:33

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