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DEFORMATION ESTIMATION METHOD, DEFORMATION ESTIMATION DEVICE AND DEFORMATION ESTIMATION PROGRAM

机译:变形估计方法,变形估计装置和变形估计程序

摘要

PROBLEM TO BE SOLVED: To provide a pattern collation device of linear graphics which can strictly identify input graphics even if deformation exists in the input graphics, its pattern collation method and a pattern collation program.;SOLUTION: In the pattern collation device which compares and collates the graphics, it is characterized by providing a deformation estimation part 11 which estimates the deformation generated in an inspection graphic which a graphic to be inspected based on information about feature points indicating features in graphics in each of the inspection graphic, a model graphic which is a graphic at a comparison origin, a deformation compensation part 12 which compensates the inspection graphic based on the information about deformation estimated by the deformation estimation part 11 and a similarity determination part 13 which compares the inspection graphic of which the deformation is compensated by the deformation compensation part 12 with the model graphic which is the graphic at the comparison origin and calculates the similarity.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:要解决的问题:提供一种线性图形的图案校对设备,即使输入图形中存在变形,也可以严格识别输入图形,其图案校对方法和图案校对程序。对图形进行核对,其特征在于,提供变形估计部11,该变形估计部11基于表示各检查图形中的图形中的图形的特征​​点的特征点的信息,来估计检查图形即检查图形中产生的变形。图4是比较起点的图形,变形校正部12根据变形估计部11估计出的变形信息对检查图形进行补偿,相似度判定部13比较通过变形校正后的检查图形的检查图形。带有模型图形的变形补偿部分12 ich是比较原点处的图形,并计算相似度。;版权所有:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP2006012196A

    专利类型

  • 公开/公告日2006-01-12

    原文格式PDF

  • 申请/专利权人 NEC CORP;

    申请/专利号JP20050272985

  • 发明设计人 KADOTA HIROSHI;

    申请日2005-09-20

  • 分类号G06T7/00;

  • 国家 JP

  • 入库时间 2022-08-21 21:56:12

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