APPARATUS AND METHOD FOR FLATTENING OBJECT TO BE INSPECTED AND X-RAY FOREIGN MATTER DETECTION SYSTEM

摘要

PROBLEM TO BE SOLVED: To provide a flattening method of stably supplying objects to be inspected of a uniform thickness, an apparatus of a simple constitution for flattening objects to be inspected continuously and stably supplying the objects to be inspected, and an X-ray foreign matter detection system.;SOLUTION: The X-ray foreign matter detection system 20 irradiates X-rays to viscid objects to be inspected and to be transferred over a transfer path 21 and detects foreign matter in the objects to be inspected on the basis of the amount of transmitted X-rays. The apparatus 50 for flattening objects to be inspected is arranged on the upstream side of the transfer path 21 of the X-ray foreign matter detection system 20 and provided with a discharge nozzle 51 comprising both an introduction part for taking in the objects to be inspected force-fed from the outside and a discharge opening part for discharging the objects to be inspected, from the introduction part, in a prescribed cross section different from that in the introduction part. In the discharge opening part, both a pair of parallel wall surfaces in parallel with the transfer path 21 and a connecting wall surface for connecting both end parts of the parallel wall surfaces to each other are formed. The discharge opening part has a horizontally long discharge opening shape having both a prescribed opening height corresponding to the layer thickness of the objects to be inspected over the transfer path and an opening width larger than the height.;COPYRIGHT: (C)2006,JPO&NCIPI