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SCANNING POSITION DETECTOR OF SCANNING OPTICAL SYSTEM, SCANNING POSITION DETECTING METHOD OF THE SCANNING OPTICAL SYSTEM AND THE SCANNING OPTICAL SYSTEM AND IMAGE FORMING APPARATUS
SCANNING POSITION DETECTOR OF SCANNING OPTICAL SYSTEM, SCANNING POSITION DETECTING METHOD OF THE SCANNING OPTICAL SYSTEM AND THE SCANNING OPTICAL SYSTEM AND IMAGE FORMING APPARATUS
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机译:扫描光学系统的扫描位置检测器,扫描光学系统和扫描光学系统的扫描位置检测方法以及图像形成装置
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摘要
PROBLEM TO BE SOLVED: To provide a scanning position detector of a scanning optical system with which linearity is measured in a short time and with high precision without requiring a special evaluation pattern and with which versatility is made high, a scanning position detecting method of the scanning optical system, the scanning optical system which is provided with the scanning position detector or the scanning position detecting method and an image forming apparatus.;SOLUTION: The scanning position detector is provided with light receiving elements 66, which are provided on the back surface position of slits 64 that are formed along the normal direction with respect to a beam spot scanning direction to pass light beams, and measures the linearity of the scanning by detecting a beam spot that crosses the slits 64 employing the light receiving elements 66 so as to measure the passing time interval of the beam spot. The slits 64 are provided over the total height of an image and are provided for equal to or more than three. The light receiving elements 66 can be arranged on the back surface position of all slits 64 corresponding to the main scanning direction of the beam spot.;COPYRIGHT: (C)2006,JPO&NCIPI
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