首页> 外国专利> METHOD FOR ACQUIRING DOT DIAMETER CORRECTION FACTOR, DOT DIAMETER MEASURING METHOD, DOT DIAMETER ABNORMALITY DETECTION METHOD AND DOT DIAMETER MEASURING DEVICE, DOT DIAMETER ABNORMALITY DETECTION DEVICE, AND DROP DELIVERY SYSTEM

METHOD FOR ACQUIRING DOT DIAMETER CORRECTION FACTOR, DOT DIAMETER MEASURING METHOD, DOT DIAMETER ABNORMALITY DETECTION METHOD AND DOT DIAMETER MEASURING DEVICE, DOT DIAMETER ABNORMALITY DETECTION DEVICE, AND DROP DELIVERY SYSTEM

机译:点直径校正因子的获取方法,点直径测量方法,点直径异常检测方法和点直径测量装置,点直径异常检测设备以及滴送系统

摘要

PROBLEM TO BE SOLVED: To provide a method for acquiring dot diameter correction factor for easily and quickly measuring a dot diameter by being considered in measurement error due to influence of brightness of electronic images, and to provide a dot diameter measuring method, a dot diameter abnormality detection method, a dot diameter measuring device, a dot diameter abnormality detection device and a drop delivery system.;SOLUTION: The method for acquiring dot diameter correction factor that acquires a correction factor for correcting a measuring value of a dot diameter in the electronic images includes: an image acquiring step for acquiring the electronic images of dot columns composed of a known dot column; a dot diameter measuring step for measuring the dot diameter of the electronic images; and a correction factor acquisition for acquiring the correction factor making the measuring value and the value of the known dot diameter.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:提供一种获取点直径校正因子的方法,该点直径校正因子通过考虑由于电子图像的亮度的影响而引起的测量误差而容易且快速地测量点直径,并且提供一种点直径测量方法,点直径异常检测方法,点直径测量装置,点直径异常检测装置和液滴输送系统。解决方案:用于获得点直径校正因子的方法,该方法获取用于校正电子设备中的点直径的测量值的校正因子。图像包括:图像获取步骤,用于获取由已知点列组成的点列的电子图像;点直径测量步骤,用于测量电子图像的点直径; COPYRIGHT:(C)2007,JPO&INPIT;和获得校正因子的校正因子,用于获取测量值和已知点直径的值的校正因子。

著录项

  • 公开/公告号JP2006266982A

    专利类型

  • 公开/公告日2006-10-05

    原文格式PDF

  • 申请/专利权人 SEIKO EPSON CORP;

    申请/专利号JP20050087929

  • 发明设计人 ITO YOSHIHIRO;

    申请日2005-03-25

  • 分类号G01B11/08;B41J2/01;

  • 国家 JP

  • 入库时间 2022-08-21 21:53:45

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