首页> 外国专利> DESIGN PATTERN CORRECTING APPARATUS, DESIGN PATTERN CORRECTING METHOD, DATA CALCULATING APPARATUS FOR SIZE SETTING, DATA CALCULATING METHOD FOR SIZE SETTING, AND PROGRAM

DESIGN PATTERN CORRECTING APPARATUS, DESIGN PATTERN CORRECTING METHOD, DATA CALCULATING APPARATUS FOR SIZE SETTING, DATA CALCULATING METHOD FOR SIZE SETTING, AND PROGRAM

机译:设计图案校正装置,设计图案校正方法,用于尺寸设定的数据计算装置,用于尺寸设定的数据计算方法以及程序

摘要

PROBLEM TO BE SOLVED: To provide a design pattern correcting apparatus with a higher process speed compared to a conventional apparatus.;SOLUTION: The design pattern correcting apparatus includes: a conversion data holding unit 20 that holds the data to convert the proportion of repeated patterns included in a design pattern to the design pattern into the size of a process area per one correction process by the optical proximity effect; a proportion calculating unit 22 that calculates the proportion of repeated patterns in a design pattern as the objective design pattern of the process; an area size setting unit 24 that sets the process area size in the objective design pattern based on the proportion of the repeated patterns calculated by the proportion calculating unit 22 and on the data held by the conversion data holding unit 20; and a correcting unit 26 that performs the optical proximity correction on the objective design pattern in the process area size set by the area size setting unit 24.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:提供一种比传统设备具有更高处理速度的设计图案校正设备;解决方案:设计图案校正设备包括:转换数据保存单元20,其保存数据以转换重复图案的比例通过光学接近效应,将设计图案包含到设计图案中,使每个校正处理的处理区域的大小成为设计区域的大小。比例计算单元22计算重复图案在设计图案中的比例作为该过程的客观设计图案;区域尺寸设定单元24,基于由比例计算单元22计算出的重复图案的比例和由转换数据保持单元20保持的数据,在目标设计图案中设定处理区域尺寸;校正单元26,其对由区域尺寸设定单元24设定的处理区域尺寸中的目标设计图案进行光学接近度校正。COPYRIGHT:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP2006235184A

    专利类型

  • 公开/公告日2006-09-07

    原文格式PDF

  • 申请/专利权人 SEIKO EPSON CORP;

    申请/专利号JP20050048841

  • 发明设计人 CHIBA KAZUAKI;

    申请日2005-02-24

  • 分类号G03F1/08;G03F7/20;H01L21/027;H01L21/82;

  • 国家 JP

  • 入库时间 2022-08-21 21:53:29

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