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STAIN MEASURING INSTRUMENT AND STAIN MEASURING METHOD

机译:污点测量仪器和污点测量方法

摘要

PROBLEM TO BE SOLVED: To provide a stain measuring instrument capable of quantitatively showing the adhesion amount of a stain, easy to grasp the adhesion state of the stain and capable of measuring even a slight stain, and to provide a stain measuring method.;SOLUTION: A pair of V blocks 12a and 12b are fixed on both ends of the upper surface of a sample stand 11 and a heating pipe 1 can be placed as a test member. The sample stand 11 can be moved to the left and right by driving a motor 10a, and an infrared semiconductor laser 17a and an infrared sensor 17b are attached to the back of the leading end of an arm 14, in a state of facing each other so as to hold the heating pipe 1.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:提供一种污渍测量仪器,其能够定量地显示污渍的附着量,易于掌握污渍的附着状态并且甚至能够测量轻微的污渍,并且提供一种污渍测量方法。 :一对V形块12a和12b固定在样品台11的上表面的两端,并且可以放置加热管1作为测试构件。通过驱动电动机10a,能够使样品台11左右移动,在臂14的前端的背面安装有彼此相对的状态的红外线半导体激光器17a和红外线传感器17b。以便固定加热管1 .;版权所有:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP2006105781A

    专利类型

  • 公开/公告日2006-04-20

    原文格式PDF

  • 申请/专利权人 HAKUTO CO LTD;

    申请/专利号JP20040292693

  • 发明设计人 ISHIKAWA JIRO;ONISHI NORIHIKO;

    申请日2004-10-05

  • 分类号G01N21/59;

  • 国家 JP

  • 入库时间 2022-08-21 21:53:18

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