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POTENTIAL CHANGE MEASURING METHOD AND POTENTIAL CHANGE MEASURING DEVICE

机译:电位变化测量方法和电位变化测量装置

摘要

PROBLEM TO BE SOLVED: To improve measurement spatial resolution in terms of a measuring method and measuring device in which a photoreceptor is exposed with a minute spot of light to cause a surface potential change in the minute area, a dielectric current is measured using the potential change, and the level of the surface potential before the exposure is determined from the magnitude of its signal.;SOLUTION: The photoreceptor drum K to be measured is charged with a charger 6, the surface of the photoreceptor drum K is exposed with a laser beam light source 2 so that a surface potential change is caused in the minute area. After the exposure, a dielectric current is detected with an electrode 8 near the surface of the photoreceptor drum K. The electrode 8 is disposed within a plane formed by incident light and the normal at the position where exposure incident light is made incident on the photoreceptor drum K and out of an angle formed by the incident angle and a specular reflection angle, and out of a plane formed by the incident light and the normal.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:要解决的问题:为了提高测量方法和测量设备的测量空间分辨率,在该方法和测量设备中,感光器暴露于微小的光斑中,从而引起微小区域中的表面电势变化,使用电势来测量介电电流改变,然后根据其信号的大小确定曝光前的表面电势。解决方案:要测量的感光鼓K用充电器6充电,感光鼓K的表面用激光曝光。光束光源2,从而在微小区域内引起表面电势变化。曝光后,在感光鼓K的表面附近用电极8检测到介电电流。电极8被布置在由入射光和法线形成的平面内,在使曝光入射光入射到感光体的位置处。鼓K入射角和镜面反射角所成的角度,以及入射光和法线所成平面的相角; COPYRIGHT:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP2006039104A

    专利类型

  • 公开/公告日2006-02-09

    原文格式PDF

  • 申请/专利权人 RICOH CO LTD;

    申请/专利号JP20040217195

  • 发明设计人 MASUDA KIYOSHI;

    申请日2004-07-26

  • 分类号G03G21/00;G01R29/12;

  • 国家 JP

  • 入库时间 2022-08-21 21:51:29

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