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Polishing apparatus and polishing method by electrorheological fluid

机译:电流变液的研磨装置及研磨方法

摘要

PROBLEM TO BE SOLVED: To provide a polishing method for a polished object that is efficient in polishing on every polished object and can suppress a variation in polishing characteristics such as polishing pressure whether the surface of the polished object is conductive or nonconductive.;SOLUTION: The polishing method uses a polishing device 100, which polishes a silicon wafer as the polished object 40 by interposing a liquid crystal system electrorheological fluid functioning as abrasive between a disklike board 10 whose polishing plane 11 carries positive electrodes 11A and negative electrodes 11B opposed in multiple concentric rings, and the silicon wafer arranged with a polished surface 40A thereof opposed to the baseboard 10, and changing the viscosity of the liquid crystal system electroviscous fluid via voltage application while moving the baseboard 10 and the silicon wafer relatively in a direction parallel to the polishing plane 11.;COPYRIGHT: (C)2002,JPO
机译:要解决的问题:提供一种抛光对象的抛光方法,该方法可以有效抛光每个抛光对象,并且无论抛光对象的表面是导电的还是不导电的,都可以抑制抛光特性(例如抛光压力)的变化。抛光方法使用抛光装置100,该抛光装置100通过将起研磨剂作用的液晶系统电流变流体插入圆盘状板10之间来抛光硅晶片作为抛光对象40,圆盘状板10的抛光平面11带有多个正对着正电极11A和负电极11B。同心环,其硅晶片的抛光表面40A与基板10相对,并通过施加电压改变液晶系统电粘性流体的粘度,同时沿平行于基板10的方向相对移动基板10和硅晶片。抛光平面11 .;版权:(C)2002,JPO

著录项

  • 公开/公告号JP3743977B2

    专利类型

  • 公开/公告日2006-02-08

    原文格式PDF

  • 申请/专利权人 古荘 純次;

    申请/专利号JP20000396856

  • 发明设计人 井上 昭夫;

    申请日2000-12-27

  • 分类号B24B37/04;B24B37/00;

  • 国家 JP

  • 入库时间 2022-08-21 21:48:40

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