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METHOD AND SYSTEM FOR DETECTING POTENTIAL RELIABILITY FAILURES OF INTEGRATED CIRCUIT
METHOD AND SYSTEM FOR DETECTING POTENTIAL RELIABILITY FAILURES OF INTEGRATED CIRCUIT
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机译:检测集成电路潜在可靠性故障的方法和系统
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摘要
A method and system for detecting a potential reliability problem cause by electrical bridging in an integrated circuit. A voltage difference is created between two conducting lines in the integrated circuit to accelerate the bridging effect for a predetermined period of time. The conducting lines are detected to determine whether an undesired connection has occurred due to the bridging effect between the conducting lines.
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