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Wave interrogated near field arrays system and method for detection of subwavelength scale anomalies

机译:用于子波长尺度异常检测的波探近场阵列系统及方法

摘要

An array of antenna elements (20) can be used to detect subwavelength sized anomalies on a surface below the array. An array (20) is illuminated at optical frequencies by a coherent optical energy source (26). The change in reactance and radiated power of the antenna elements that results from the proximity of the anomaly to the near field of the antenna element's open-circuited is detected and holographically filtered to eliminate the radiation caused by the antenna array itself. Image processing is performed on the detected scattered radiation (100) to determine whether an anomaly is present and to locate the anomaly and its characteristics.
机译:天线元件阵列( 20 )可用于检测阵列下方表面上亚波长尺寸的异常。阵列( 20 )由相干光能源( 26 )以光频率照明。由异常接近天线元件的开路的近场引起的天线元件的电抗和辐射功率的变化被检测并被全息滤波以消除由天线阵列本身引起的辐射。对检测到的散射辐射( 100 )进行图像处理,以确定是否存在异常,并定位异常及其特征。

著录项

  • 公开/公告号US2006065856A1

    专利类型

  • 公开/公告日2006-03-30

    原文格式PDF

  • 申请/专利权人 RODOLFO E. DIAZ;MICHAEL WATTS;

    申请/专利号US20050505831

  • 发明设计人 MICHAEL WATTS;RODOLFO E. DIAZ;

    申请日2003-03-05

  • 分类号G01N21/86;G01V8/00;

  • 国家 US

  • 入库时间 2022-08-21 21:45:29

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