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Embedded test and repair scheme and interface for compiling a memory assembly with redundancy implementation
Embedded test and repair scheme and interface for compiling a memory assembly with redundancy implementation
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机译:嵌入式测试和修复方案以及用于以冗余实现方式编译内存组件的接口
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摘要
An embedded test and repair (ETR) scheme and interface for generating a self-test-and-repair (STAR) memory device using an integrated design environment. User interface and supporting program code is operable to provide a dialog box for defining a memory group that includes one or more memory instances, each having corresponding fuse element requirements based on its configuration data. BIST elements and a processor compiler for providing ETR functionality are also specified via suitable portions of the integrated GUI. A fuse equation is employed for computing the number of fuses for each memory instance, which equation is derived based on the memory configuration. Fuse information for each memory instance is automatically passed to a fuse compiler that generates a fuse box having an appropriate number of fuses that can accommodate the fuse requirements of the memory instances of the group.
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