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Method and apparatus for identifying lead-related conditions using lead impedance measurements

机译:使用导线阻抗测量来识别导线相关条件的方法和装置

摘要

A method and apparatus for automatically detecting and diagnosing lead-related conditions is provided. Specifically, relatively short-term and relatively long-term impedance parameters are determined for detecting an impedance trend indicative of a lead-related condition such as an open circuit, which may be due to a conductor fracture or poor connection to an associated implantable medical device, or a short circuit due to an insulation breach. Monitoring of multiple lead impedance parameters is performed to diagnose a lead-related condition based on a number of diagnostic criteria. Supplementary analysis of multiple lead impedance parameter trends may be performed to identify lead-specific conditions, such as metal ion oxidation induced insulation degradation. A lead-related condition diagnosis and supporting data are stored in memory for uplinking to an external device for review by a clinician. A recommended corrective action and/or a patient notification signal for a lead-related condition may optionally be provided.
机译:提供了一种用于自动检测和诊断与铅相关的状况的方法和设备。具体而言,确定相对短期和相对长期的阻抗参数以检测指示与引线相关的状况(例如,开路)的阻抗趋势,这可能是由于导体断裂或与相关的可植入医疗设备的连接不良造成的,或由于绝缘破坏引起的短路。进行多个导线阻抗参数的监视以基于许多诊断标准来诊断与导线相关的状况。可以对多个引线阻抗参数趋势进行补充分析,以识别特定于引线的条件,例如金属离子氧化引起的绝缘劣化。铅相关的状况诊断和支持数据存储在内存中,用于上行到外部设备以供临床医生检查。可以可选地提供针对铅相关疾病的建议纠正措施和/或患者通知信号。

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