Atomic force microscopy, method of measuring surface configuration using the same, and method of producing magnetic recording medium

摘要

To provide an atomic force microscopy which allows the measurement of the configuration of a surface being measured by using the phenomenon observed between the surface being measured and a probe approaching thereto at very fine distance.;By selecting the material of the tip surface of said probe such that the surface energy of said probe tip becomes less than the interface energy between the tip surface and the surface being measured, thereby the surface configuration of soft body, or soft fouling adhered to the body surface can be measured.;A method of measuring the surface configuration and a method of producing magnetic recording medium using the same are also provided.