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System and method for removing the relative phase uncertainty in device characterizations performed with a polarimeter
System and method for removing the relative phase uncertainty in device characterizations performed with a polarimeter
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机译:用于消除通过旋光仪进行的器件表征中的相对相位不确定性的系统和方法
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摘要
By making combined interferometric and polarimetric measurements on a device under test, the relative phase uncertainty in device characterizations performed with a polarimeter or polarization analyzer alone is removed. This allows determination of the group delay to within a constant offset and the chromatic dispersion of the device under test.
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