首页> 外国专利> Defect influence degree evaluation method and design support system

Defect influence degree evaluation method and design support system

机译:缺陷影响度评估方法和设计支持系统

摘要

At a stage before manufacture (product design stage or manufacturing process design stage), influence of defect occurrence in a component or process on other components and processes is estimated, and defect importance is evaluated to support the manufacturing process design. Failure rates of components are previously stored in a database. At a product design stage, an assembly fraction defective is calculated for an assembly process of each component of the product. Component arrangement relations are extracted from product design information. A component fraction defective is calculated based on the assembly fraction defective and the component failure rate. A numerical value indicating an influence degree of each assembly process is calculated by multiplying component fraction defectives by coefficients based on of the component arrangement relations and the component fraction defective, for relating components in each assembly process. Thereby, influence degrees of each component and process are evaluated.
机译:在制造前的阶段(产品设计阶段或制造过程设计阶段),估计组件或过程中出现缺陷对其他组件和过程的影响,并评估缺陷的重要性以支持制造过程设计。组件的故障率先前已存储在数据库中。在产品设计阶段,针对产品的每个组件的组装过程计算有缺陷的组装分数。从产品设计信息中提取组件布置关系。基于组装分数缺陷和组件故障率来计算分数缺陷。通过将部件分数缺陷乘以基于部件布置关系和部件分数缺陷的系数来计算表示每个组装过程的影响程度的数值,以在每个组装过程中关联部件。从而,评估每个组件和处理的影响程度。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号