Data transfer method for use between X-ray and analysis system and coupled X-ray analysis component, with memory devices fitted on X-ray analysis component

摘要

The method is for data transfer between an X-ray analysis system (3) and a coupled X-ray analysis component (2). Memory devices (2A) are fitted on the X-ray analysis component and in the coupled state the memory devices can be read through the X-ray analysis system. During operation, actual operational parameters can be stored in the memory devices. Such parameters can cover the X-ray analysis component and/or the X-ray analysis system and/or the operating ambiance and/or other relevant operating data. X-ray analysis can occur with the aid of different techniques, i.e. X-ray diffraction, X-ray fluorescence, with particular application and crystalline structure of natural and industrially produced materials, with X-ray fluorescent spectrometry generally applicable for identification and determination of concentrations of elements in specimens of materials, be they in solid, liquid or powder form. The X-ray analysis component comprises an X-ray tube and the X-ray analysis system consists of an X-ray detector (4) for receipt of X-ray radiation from the X-ray tube. An optical system (5) is provided for the X-ray detector for controlled conduct of the X-ray radiation. The system also has a high voltage generator (6) for the X-ray tube.