OPTICAL TIME DOMAIN REFLECTOMETRY SYSTEM AT DIFFERENT WAVELENGTHS

摘要

The invention relates to an optical time domain reflectometry system (1) for determining a power response from a device under test - DUT (3). For providing power information data, an optical transmitter (11) launches a probe signal (S1) with a first wavelength (λo) into a DUT (3), an optical receiver (12) determines optical power information of a first return signal (R1) returning from the DUT (3) at a second wavelength (λ1) wherein the second wavelength is not equal to the first wavelength (λo), and an analyzer (13) analyzes the power information determined by the optical receiver (12), and generating data to be at least one of: visualized, stored, and further processed.