首页> 外国专利> METHOD FOR DETERMINING THE REAL ABSOLUTE POSITION OF AN ADDITIONAL ELEMENT WHICH CAN MOVE IN RELATION TO A BASE ELEMENT, CORRESPONDING METHOD FOR ESTABLISHING A CORRECTION FACTOR TABLE, CORRESPONDING DETERMINING DEVICE AND MEMORY DEVICE IN WHICH A CORRECTION FACTOR TABLE IS STORED

METHOD FOR DETERMINING THE REAL ABSOLUTE POSITION OF AN ADDITIONAL ELEMENT WHICH CAN MOVE IN RELATION TO A BASE ELEMENT, CORRESPONDING METHOD FOR ESTABLISHING A CORRECTION FACTOR TABLE, CORRESPONDING DETERMINING DEVICE AND MEMORY DEVICE IN WHICH A CORRECTION FACTOR TABLE IS STORED

机译:确定可以相对于基本元素移动的附加元素的实际绝对位置的方法,建立校正因子表的相应方法,存储校正因子表的相应确定设备和存储设备

摘要

An additional element (2) can move in relation to a base element (1). A sensor device (4), which is connected to the base element (1), scans a material measure (5) which cooperates with the additional element (2) and which can move in relation to the sensor element (4). The sensor element (4) comprises at least two signal sensing elements (6), each of which delivers a binarizable measuring signal (x,y). A new area, wherein the material measure (5) is arranged relative to the sensor device (4), can be determined with the aid of simultaneously detected binarized measuring signals (x,y) per se or with the aid of a modification of at least one of the binarized measuring signals (x,y) in conjunction with an already known area. An evaluation device (9) determines, with the aid of the measuring signals (x,y), a position of the material measure (5) in relation to the sensor device (4) and determines therefrom an apparent absolute position (p',p') of the additional element (2) in relation to the base element (1). At least one correction factor (k), determined by the apparent absolute position (p',p') is read from a correction factor table (12) containing at least one correction factor (k) for each area and a real absolute position (p) of the additional element (2) is determined therefrom in relation to the base element (1). In order to draw up the correction factor table (12), the absolute position (p) is also determined at least once previously in each area by means of a position detection device (11) and a corresponding correction factor (k) is stored in the correction factor table (12).
机译:附加元件(2)可以相对于基础元件(1)移动。连接至基础元件(1)的传感器装置(4)扫描与附加元件(2)配合并且可相对于传感器元件(4)移动的材料量度(5)。传感器元件(4)包括至少两个信号感测元件(6),每个信号感测元件(6)传送可二进制化的测量信号(x,y)。可以借助同时检测到的二值化测量信号本身(x,y)或借助对at的修改来确定新的区域,其中相对于传感器设备(4)设置了材料度量(5)。二进制测量信号(x,y)中的至少一个与已知区域结合。评估装置(9)借助测量信号(x,y)确定材料量度(5)相对于传感器装置(4)的位置,并由此确定表观绝对位置(p',相对于基础元素(1)的附加元素(2)的p')。从表观绝对位置(p',p')确定的至少一个校正因子(k)从校正因子表(12)中读取,该校正因子表包含每个区域的至少一个校正因子(k)和实际绝对位置(由此相对于基础元件(1)确定附加元件(2)的p)。为了绘制校正系数表(12),还借助于位置检测装置(11)在每个区域中至少预先确定了绝对位置(p),并且将相应的校正系数(k)存储在其中。校正因子表(12)。

著录项

  • 公开/公告号WO2006015969A2

    专利类型

  • 公开/公告日2006-02-16

    原文格式PDF

  • 申请/专利权人 SIEMENS AKTIENGESELLSCHAFT;KNORR MARKUS;

    申请/专利号WO2005EP53822

  • 发明设计人 KNORR MARKUS;

    申请日2005-08-04

  • 分类号G01D5/244;

  • 国家 WO

  • 入库时间 2022-08-21 21:32:33

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