首页> 外国专利> SPECTRUM ANALYZER AND FREQUENCY LEVEL MEASUREMENT METHOD

SPECTRUM ANALYZER AND FREQUENCY LEVEL MEASUREMENT METHOD

机译:光谱分析仪和频率测量方法

摘要

Disclosed is a spectrum analyzer comprising a YIG oscillator whose output frequency is to be defined in response to a setpoint frequency request by means of a magnetic field that acts upon a YIG ball, only one tuning coil being provided that generates the magnetic field. The output frequency signal of the YIG oscillator is to be fed as a real value while the momentary frequency request of the spectrum analyzer is to be fed as a setpoint value of a PLL control circuit (4), with the aid of which the coil current of the tuning coil (2) is to be regulated by means of a voltage/power converter (5) that is connected downstream therefrom.
机译:公开了一种包括YIG振荡器的频谱分析仪,该YIG振荡器的输出频率将通过作用在YIG球上的磁场来响应于设定频率请求而被限定,仅设置了一个产生磁场的调谐线圈。 YIG振荡器的输出频率信号将作为实际值输入,而频谱分析仪的瞬时频率请求将作为PLL控制电路(4)的设定值输入。调谐线圈(2)的最大功率可以通过连接在其下游的电压/功率转换器(5)进行调节。

著录项

  • 公开/公告号WO2006050704A1

    专利类型

  • 公开/公告日2006-05-18

    原文格式PDF

  • 申请/专利权人 HAMEG GMBH;KUNISCH SASCHA;

    申请/专利号WO2005DE02010

  • 发明设计人 KUNISCH SASCHA;

    申请日2005-11-09

  • 分类号G01R23/173;H03L7/18;

  • 国家 WO

  • 入库时间 2022-08-21 21:31:06

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号