首页> 外国专利> METHOD FOR MEASURING THE RESIDUAL SYSTEM DIRECTIVITY AND/OR THE RESIDUAL SYSTEM PORT IMPEDANCE MATCH OF A SYSTEM-CALIBRATED VECTOR NETWORK ANALYSER

METHOD FOR MEASURING THE RESIDUAL SYSTEM DIRECTIVITY AND/OR THE RESIDUAL SYSTEM PORT IMPEDANCE MATCH OF A SYSTEM-CALIBRATED VECTOR NETWORK ANALYSER

机译:用于系统校准的矢量网络分析仪的剩余系统方向性和/或剩余系统端口阻抗匹配的测量方法

摘要

The invention relates to a method for measuring the residual system directivity and/or the residual system port impedance match of a measuring port (M) of a system-calibrated vector network analyser (N). According to said method, an output short-circuited precision air line (L) is connected and the complex reflection coefficient at the input of said precision air line (L) is measured at a series of measuring points within a predefined frequency range. To obtain the residual system directivity, the series of measured complex reflection coefficients is subjected to a discrete Fourier transform and the base band is filtered out of the spectrum that has been formed. The series of residual system directivity values is obtained by a subsequent inverse Fourier transform.
机译:本发明涉及一种用于测量系统校准的矢量网络分析仪(N)的测量端口(M)的残余系统方向性和/或残余系统端口阻抗匹配的方法。根据所述方法,连接输出短路的精密空气管线(L),并且在预定频率范围内的一系列测量点处测量所述精密空气管线(L)的输入处的复反射系数。为了获得残留的系统方向性,对一系列测得的复反射系数进行离散傅里叶变换,并从已形成的光谱中滤除基带。一系列残差系统方向性值是通过随后的逆傅立叶逆变换获得的。

著录项

  • 公开/公告号EP1483593B1

    专利类型

  • 公开/公告日2006-06-21

    原文格式PDF

  • 申请/专利权人 ROHDE & SCHWARZ GMBH & CO. KG;

    申请/专利号EP20030704667

  • 发明设计人 JAEGER HARALD;REICHEL THOMAS;

    申请日2003-02-20

  • 分类号G01R27/28;G01R35/00;

  • 国家 EP

  • 入库时间 2022-08-21 21:30:10

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