首页> 外国专利> METHOD AND APPARATUS FOR MEASURING AND MONITORING DISTANCES, PHYSICAL PROPERTIES, AND PHASE CHANGES OF LIGHT REFLECTED FROM A SURFACE BASED ON A RING-RESONATOR

METHOD AND APPARATUS FOR MEASURING AND MONITORING DISTANCES, PHYSICAL PROPERTIES, AND PHASE CHANGES OF LIGHT REFLECTED FROM A SURFACE BASED ON A RING-RESONATOR

机译:基于环形谐振器的表面反射光的距离,物理特性和相位变化的测量和监测方法和装置

摘要

A method and apparatus for performing refractive index, birefringence and optical activity measurements of a material such as a solid, liquid, gas or thin film is disclosed. The method and apparatus can also be used to measure the properties of a reflecting surface. The disclosed apparatus has an optical ring-resonator in the form of a fiber-loop resonator, or a race-track resonator, or any waveguide-ring or other structure with a closed optical path that constitutes a cavity. A sample is introduced into the optical path of the resonator such that the light in the resonator is transmitted through the sample and relative and/or absolute shifts of the resonance frequencies or changes of the characteristics of the transmission spectrum are observed. A change in the transfer characteristics of the resonant ring, such as a shift of the resonance frequency, is related to a sample's refractive index (refractive indices) and/or change thereof. In the case of birefringence measurements, rings that have modes with two (quasi)-orthogonal (linear or circular) polarization states are used to observe the relative shifts of the resonance frequencies. A reflecting surface may be introduced in a ring resonator. The reflecting surface can be raster-scanned for the purpose of height-profiling surface features. A surface plasmon resonance may be excited and phase changes of resonant light due to binding of analytes to the reflecting surface can be determined in the frequency domain.
机译:公开了一种用于对诸如固体,液体,气体或薄膜的材料进行折射率,双折射和光学活性测量的方法和设备。该方法和设备还可用于测量反射表面的特性。所公开的设备具有呈光纤环形谐振器,或跑道跟踪谐振器,或任何具有构成腔的闭合光路的任何波导环或其他结构形式的光学环形谐振器。将样品引入到谐振器的光路中,使得谐振器中的光透射过该样品,并且观察到谐振频率的相对和/或绝对位移或透射光谱的特性变化。谐振环的传递特性的变化,例如谐振频率的偏移,与样品的折射率(折射率)和/或其变化有关。在双折射测量的情况下,使用具有两个(准)正交(线性或圆形)偏振态的模的环来观察共振频率的相对位移。可以在环形谐振器中引入反射面。可以对反射表面进行光栅扫描,以达到对轮廓进行高度轮廓化的目的。可以激发表面等离子体激元共振,并且可以在频域中确定由于分析物与反射表面的结合而引起的共振光的相变。

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