Eddy current inspection method and system using multifrequency excitation and multifrequency phase analysis

摘要

An inspection system (10) is provided and includes an eddy current (EC) probe (12) configured to induce eddy currents in a part (18). The system (10) further includes an eddy current instrument (14) coupled to the EC probe (12) and configured to apply multifrequency excitation signals to the EC probe (12) to generate multifrequency response signals. The system (10) further includes a processor (16) configured to analyze the multifrequency response signals from the EC instrument (14) by performing a multifrequency phase analysis, to inspect a subsurface of the part (18).